Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

In this article, 3D polymeric atomic force microscopy (AFM) tips, referred to as 3DTIPs, are introduced. The key differences between standard silicon AFM tips and the new 3DTIPs design will be covered ...

Nanoprobes are ultra-small devices or particles designed to explore, measure, and manipulate matter at the nanoscale. These advanced tools allow scientists to study the properties, structures, and ...

Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...

Abu Dhabi, UAE, July 26, 2022: A team of researchers from NYU Abu Dhabi’s Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in ...