AZOM

Experience Unmatched AFM Precision with the Park FX200

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...
Nanowerk

Conductive Atomic Force Microscopy: Nanoscale Electrical Characterization

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
AZoNano

Advanced AFM Imaging of 200 mm Samples with Park FX200

This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...
Nanowerk

Electrochemical AFM: Nanoscale Probing of Electrochemical Processes

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...
AZoNano

Electrical AFM, An Indispensable Tool in the Semiconductor Industry

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
AZOM

The Park FX300: 300 mm AFM

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Park FX300 is intended to bridge the gap ...